OVERVIEW:DY294 is mainly used for testing the DC parameters of manifold semiconductors such as diode, transistor, controlled silicon and field effect transistor. DY294 also can be used to test the withstand voltage of capacitor, protection voltage of varistor and isolation of electrical. Meanwhile D..
OVERVIEW:
Component type (such as NPN transistor, P-Ch
MOSFET, LED, diode etc)Pinout information (such as Base, Emitter,
Collector etc)Parameter measurement (hFE, Vbe, Vf, leakage
current etc)Supports transistors MOSFETs, JFETs (gate pin
only can be identified), diodes, LEDs and l..
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